TCOB0E227M8R-EN2 >
TCOB0E227M8R-EN2
KYOCERA AVX
B- CASE / 227- CAP CODE / POLY
3267 Pcs New Original In Stock
Tantalum Capacitors
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TCOB0E227M8R-EN2 KYOCERA AVX
5.0 / 5.0 - (520 Ratings)

TCOB0E227M8R-EN2

Product Overview

1976946

DiGi Electronics Part Number

TCOB0E227M8R-EN2-DG

Manufacturer

KYOCERA AVX
TCOB0E227M8R-EN2

Description

B- CASE / 227- CAP CODE / POLY

Inventory

3267 Pcs New Original In Stock
Tantalum Capacitors
Quantity
Minimum 1

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In Stock (All prices are in USD)
  • QTY Target Price Total Price
  • 2000 0.2881 576.1636
  • 4000 0.2732 1092.7312
  • 10000 0.2576 2576.4600
  • 14000 0.2534 3547.1520
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TCOB0E227M8R-EN2 Technical Specifications

Category Tantalum Capacitors

Manufacturer KYOCERA AVX

Packaging Tape & Reel (TR)

Series -

Product Status Active

Datasheet & Documents

HTML Datasheet

TCOB0E227M8R-EN2-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8532.21.0050

Additional Information

Other Names
478-TCOB0E227M8R-EN2DKR
478-TCOB0E227M8R-EN2CT
478-TCOB0E227M8R-EN2TR
Standard Package
2,000

Reviews

5.0/5.0-(Show up to 5 Ratings)
Nest***umer
Dec 02, 2025
5.0
Der Versand ist immer pünktlich, und die Logistik-Updates sind sehr genau.
Viv***ath
Dec 02, 2025
5.0
They consistently offer prices that are lower than market average, all while maintaining packaging safety.
Star***stSun
Dec 02, 2025
5.0
Shipping process is seamless and fast.
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Frequently Asked Questions (FAQ)

What are the key reliability risks when replacing TCOB0E227M8R-EN2 with a similar 220µF polymer tantalum capacitor like the KEMET T521X227M006ATE070 in a high-vibration industrial power supply design?

While both TCOB0E227M8R-EN2 and KEMET T521X227M006ATE070 offer 220µF capacitance in B-case packaging with polymer construction, the TCOB0E227M8R-EN2 has a lower ESR (typically <70mΩ) and is rated for 6.3V with tighter tolerance, whereas the KEMET part is rated at 6.3V but may exhibit higher ESR variation under mechanical stress. In high-vibration environments, the KYOCERA AVX part’s internal construction provides better resistance to microcracking due to its robust lead-frame design. Direct replacement without re-evaluating derating margins—especially under transient load conditions—can lead to premature failure. Always validate mechanical robustness via shock/vibe testing and ensure voltage derating remains above 50% of rated voltage in your application.

Can I safely use TCOB0E227M8R-EN2 in a 5V rail with frequent 3A load transients without additional bypassing, and what layout considerations are critical to avoid voltage overshoot or capacitor stress?

The TCOB0E227M8R-EN2 is rated for 6.3V, so operating at 5V provides acceptable headroom (~25% derating), but frequent 3A load transients demand careful attention to PCB layout and system impedance. Without proper bypassing, high di/dt events can induce voltage spikes that exceed the capacitor’s surge rating. To mitigate risk, place the TCOB0E227M8R-EN2 within 5mm of the load point, use wide, low-inductance traces, and pair it with a low-ESR ceramic capacitor (e.g., 10µF X5R 0805) in parallel to handle high-frequency transients. Avoid routing power traces over splits in the ground plane, as this increases loop inductance and transient overshoot, potentially causing latent damage to the polymer tantalum structure.

How does moisture sensitivity level (MSL 3) of TCOB0E227M8R-EN2 impact high-volume SMT assembly, and what process controls are needed to prevent popcorning or performance drift during reflow?

With an MSL 3 rating (168 hours floor life), the TCOB0E227M8R-EN2 requires strict moisture control during SMT processing. Exposure beyond 168 hours at ≤30°C/60% RH necessitates baking at 125°C for 24 hours to remove absorbed moisture. In high-volume lines, this demands dry storage (<10% RH) and tracking of reel exposure time. During reflow, peak temperatures must not exceed 260°C, and the thermal profile should follow JEDEC J-STD-020—especially avoiding rapid ramp rates that induce thermal shock. Failure to control moisture can lead to internal delamination or ‘popcorning,’ which compromises long-term reliability even if electrical tests pass initially. Always validate reflow profiles with thermocouples on actual PCBs containing TCOB0E227M8R-EN2.

Is TCOB0E227M8R-EN2 a drop-in replacement for legacy MnO2-based tantalum capacitors like the AVX TPSC226M035R0150 in low-noise analog front-end circuits, and what stability trade-offs should I consider?

Although TCOB0E227M8R-EN2 offers superior ripple current handling and lower ESR than MnO2 types like the TPSC226M035R0150, it is not a direct drop-in without stability analysis. Polymer tantalums like TCOB0E227M8R-EN2 have higher leakage current and different dielectric absorption characteristics, which can affect bias points in high-impedance analog nodes. Additionally, their lower ESR may interact with LDO output impedance, potentially causing oscillation in feedback loops. Always simulate or bench-test the power delivery network with TCOB0E227M8R-EN2 in place, and consider adding a small series resistor (0.1–1Ω) if stability margins degrade. For ultra-low-noise applications, verify that increased leakage doesn’t introduce DC offset errors in precision amplifiers.

What failure modes should I anticipate when using TCOB0E227M8R-EN2 in a -40°C to +105°C automotive environment, and how does its construction compare to ceramic or aluminum polymer alternatives for long-term reliability?

In automotive temperature ranges, TCOB0E227M8R-EN2 maintains stable capacitance and low ESR due to its conductive polymer cathode, outperforming MnO2 tantalums that suffer from increased ESR at cold temperatures. However, polymer tantalums can exhibit gradual capacitance loss over time at sustained high temperatures (>85°C), unlike MLCCs which are more stable but prone to microcracks under thermal cycling. Compared to aluminum polymer capacitors, TCOB0E227M8R-EN2 offers smaller footprint and lower profile but lower surge robustness. Key failure risks include accelerated aging above 85°C and susceptibility to voltage transients—always implement input TVS diodes and maintain >50% voltage derating. For mission-critical automotive systems, conduct HALT testing with TCOB0E227M8R-EN2 under combined thermal, electrical, and mechanical stress to validate lifetime assumptions.

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