CY29FCT818ATDMB >
CY29FCT818ATDMB
Texas Instruments
DIAGNOSTIC SCAN REGISTER 24-CDIP
2448 Pcs New Original In Stock
Shift Register, Pipeline 1 Element 8 Bit 24-CDIP
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CY29FCT818ATDMB
5.0 / 5.0 - (273 Ratings)

CY29FCT818ATDMB

Product Overview

11232895

DiGi Electronics Part Number

CY29FCT818ATDMB-DG

Manufacturer

Texas Instruments
CY29FCT818ATDMB

Description

DIAGNOSTIC SCAN REGISTER 24-CDIP

Inventory

2448 Pcs New Original In Stock
Shift Register, Pipeline 1 Element 8 Bit 24-CDIP
Quantity
Minimum 1

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CY29FCT818ATDMB Technical Specifications

Category Logic, Shift Registers

Manufacturer Texas Instruments

Packaging -

Series 29FCT

Product Status Active

Logic Type Register, Pipeline

Output Type Tri-State

Number of Elements 1

Number of Bits per Element 8

Function -

Voltage - Supply 4.75V ~ 5.25V

Operating Temperature -55°C ~ 125°C

Grade -

Qualification -

Mounting Type Through Hole

Package / Case 24-CDIP (0.300", 7.62mm)

Supplier Device Package 24-CDIP

Datasheet & Documents

HTML Datasheet

CY29FCT818ATDMB-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) Not Applicable
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
296-CY29FCT818ATDMB
Standard Package
1

Reviews

5.0/5.0-(Show up to 5 Ratings)
울***소리
Dec 02, 2025
5.0
가격도 착하고 친절한 서비스 덕분에 만족도가 굉장히 높습니다.
Bai***Doux
Dec 02, 2025
5.0
Je recommande vivement leur service pour leur rapidité et leur support.
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Dec 02, 2025
5.0
L'expédition est constamment rapide, ce qui montre leur engagement envers la satisfaction client.
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Dec 02, 2025
5.0
The combination of friendly service and speedy logistics made this a five-star experience.
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Customer service representatives are courteous and attentive to detailed questions.
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Dec 02, 2025
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Frequently Asked Questions (FAQ)

Can the CY29FCT818ATDMB be safely replaced with a 74FCT818 in a high-reliability automotive diagnostic system, and what risks should I consider?

While the 74FCT818 from other manufacturers (e.g., NXP or ON Semiconductor) shares similar functionality, direct replacement of the CY29FCT818ATDMB requires careful evaluation. Key risks include subtle timing differences in propagation delay and output enable characteristics, which may affect scan chain integrity in diagnostic systems. Additionally, the CY29FCT818ATDMB is qualified for -55°C to 125°C operation, whereas many commercial-grade 74FCT818 variants are only rated to 85°C. For automotive applications, ensure the replacement part has equivalent AEC-Q100 qualification and CDIP packaging robustness. Always validate timing margins and tri-state behavior under worst-case voltage and temperature conditions before committing to a drop-in replacement.

What design constraints should I consider when using the CY29FCT818ATDMB in a mixed-voltage 3.3V/5V system with level translation?

The CY29FCT818ATDMB operates exclusively at 4.75V–5.25V and does not support 3.3V input thresholds, making it incompatible with direct interfacing to 3.3V logic without level shifting. If your system uses 3.3V microcontrollers or FPGAs, you must implement a bidirectional level translator (e.g., TXB0108) on the data and control lines. Avoid relying on the tri-state outputs to float when disabled—ensure pull-up or pull-down resistors are used to prevent bus contention. Also, note that the CDIP package is through-hole, so PCB layout must accommodate higher parasitic inductance; keep clock and data traces short to maintain signal integrity in high-speed diagnostic scan chains.

How does the CY29FCT818ATDMB compare to the CY74FCT818T in terms of power consumption and thermal performance in a densely populated industrial control board?

The CY29FCT818ATDMB and CY74FCT818T are both 8-bit pipeline registers from the FCT family, but the '29FCT' series typically features lower quiescent current and improved thermal characteristics due to process optimizations. In high-density industrial designs where board temperature can exceed 85°C, the CY29FCT818ATDMB’s extended operating range (-55°C to 125°C) provides greater margin. However, the CY74FCT818T may offer slightly faster propagation delays in some speed grades. For thermal reliability, the 24-CDIP package of the CY29FCT818ATDMB allows better heat dissipation than SOIC variants, but ensure adequate airflow and avoid placing it near high-power components to prevent localized heating that could degrade long-term performance.

Is the CY29FCT818ATDMB suitable for use in boundary scan or JTAG diagnostic applications, and what integration pitfalls should I avoid?

Yes, the CY29FCT818ATDMB is well-suited for diagnostic scan register applications due to its tri-state outputs and pipeline architecture, which support clean data shifting in test modes. However, integration into a JTAG or boundary scan chain requires careful attention to clock skew and enable signal timing. The tri-state control (OE) must be synchronized with the system test controller to avoid bus conflicts during mode transitions. Also, because it uses a through-hole CDIP package, ensure your PCB stack-up accounts for lead inductance, which can distort high-frequency clock signals. Always include a test point on the serial output to allow in-circuit validation of the scan chain integrity during manufacturing diagnostics.

What reliability concerns should I evaluate when deploying the CY29FCT818ATDMB in a military-grade system with extended thermal cycling?

Although the CY29FCT818ATDMB is rated for -55°C to 125°C and is RoHS3 compliant, military applications often involve rapid thermal cycling that can stress the CDIP package leads and internal bond wires. Verify that your solder joints and PCB material (e.g., high-Tg FR4 or polyimide) can withstand repeated expansion cycles without cracking. The through-hole mounting of the CY29FCT818ATDMB offers better mechanical stability than surface-mount parts under vibration, but ensure proper strain relief and conformal coating to prevent moisture ingress. Additionally, confirm with Texas Instruments whether the specific lot is traceable and meets MIL-STD-883 screening requirements, as standard commercial parts may not undergo the same burn-in or hermeticity testing required for mission-critical systems.

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